Advanced Imaging and Analytical Facility

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ADVANCED IMAGING AND ANALYTICAL FACILITY

The Advanced Imaging and Analytical Facility (AI&AF) is a core microscopy facility at NCSCM. The AI&AF facility has confocal, live-cell, scanning electron microscopes (SEM), Wavelength Dispersive X-ray Fluorescence (WDXRF), and fluorescence microscopes with numerous specialized advanced software for processing and analysis of multi-dimensional images. This facility also includes dedicated lab space for specimen processing and analysis suites to allow researchers to prepare samples, take images, and analyze them at one site.

SEM is a well-known non-destructive technique that uses an electron beam probe to analyze samples surface down to nanoscale. WDXRF is used for the accurate determination of the elemental composition of the sample in the form of spectra (histograms), in which individual elements can be identified. The AI&AF provides life and physical science researchers a wide spectrum of sample preparation tools and techniques and imaging technologies.

Analytical Capabilities:
  • Electron Microscopy
  • Optical Microscopy

THEMATIC AREAS

  • Life science and Physical science

CONTACT INFORMATION

Technical Manager

Dr. Hariharan, G.
Email:hariharan@ncscm.res.in

Dr. Bitopan Malakar
Email:bitopan@ncscm.res.in

INSTRUMENTS

Scanning Electron Microscope (SEM)

Make: Tescan
Model: VEGA3

For high resolution three dimensional imaging of  structure and surfaces of even wet environmental samples; without prior specimen preparation.

Wave length Dispersive X-Ray Fluorescence Spectrometer (WD-XRF)

Make: Thermo Scientific
Model: ARL PERFORM’X

To determine the chemical composition of a wide  variety of sample types including solids, liquids, slurries and loose powders. It can analyze elements from beryllium to uranium in concentration ranges from 100 wt% to sub-ppm levels